Paper Publications
Dynamic Modeling of Stress-Induced Defect Expansion in VCSELs
2024-05-15 Hits:
Affiliation of Author(s):信息科学与工程学院
Journal:IEEE PHOTONICS TECHNOLOGY LETTERS Journal
First Author:张玉岐
Document Code:A9B4FF21E8E84D0287DF0BD08CB3C450
Volume:16
Issue:3
Number of Words:7421
Translation or Not:no
Date of Publication:2024-05-15
Date of Publication:2024-05-15
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