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一种用于有源阵列天线幅相测试的可调探头阵列
2021-09-29  Hits:

Affilication of Author(s):信息科学与工程学院
Type of Patent:发明
Application Number:202010847551.7
Number of Inventors:2
Service Invention or Not:no
Publication Date:2021-08-27
Authorization Date:2021-08-27
Publication Date:2021-08-27
Authorization Date:2021-08-27