一种以金纳米团簇为发光体实施缺陷诱导型单色电化学发光免疫分析的方法
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Title:一种以金纳米团簇为发光体实施缺陷诱导型单色电化学发光免疫分析的方法
Institution:化学与化工学院
Type of Patent:Invent
Application Number:202210035516.4
Number of Inventors:1
Service Invention or Not:No
Application Date:2022-01-13
Publication Date:2024-10-15
Authorization Date:2024-10-15
Release Time:2024-10-17