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Characterization of ZnSiP2 films frown on Si substrate by liquid phase epitaxy: morphology, composition, and interface microstructure

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Affiliation of Author(s):晶体材料研究所

Journal:Crystal Growth&Design

Discipline:Engineering

First-Level Discipline:Materials Science and Engineering

Document Type:J

Volume:19

Issue:7

Page Number:3681-3687

Number of Words:5000

Translation or Not:no

Date of Publication:2019-06-01

Included Journals:SCI

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