Impact of Hafnium Doping on Phase Transition, Interface, and Reliability Properties of ZrxHf1–xO2-Based Capacitors.
Release Time:2026-04-01
Hits:
- Title of Paper:
- Impact of Hafnium Doping on Phase Transition, Interface, and Reliability Properties of ZrxHf1–xO2-Based Capacitors.
- Journal:
- ACS Applied Electronic Materials
- DOI Number:
- 10.1021/acsaelm.4c01025
- Translation or Not:
- No
- Date of Publication:
- 2024-08
- Links to Published Journals:
- https://pubs.acs.org/doi/10.1021/acsaelm.4c01025
- Release Time:
- 2026-04-01