中文

一种测量非线性光学系数的z扫描测量装置及测量方法

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  • Affilication of Author(s):化学与化工学院

  • Type of Patent:发明

  • Application Number:202210083283.5

  • Number of Inventors:2

  • Service Invention or Not:no

  • Application Date:2022-01-25

  • Publication Date:2024-06-11

  • Authorization Date:2024-06-11

  • Publication Date:2024-06-11

  • Application Date:2022-01-25

  • Authorization Date:2024-06-11

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