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An In Situ Reflectance Spectroscopic Investigation to Monitor Two-Dimensional MoS2 Flakes on a Sapphire Substrate
Date of Publication:2020-12-01 Hits:

Affiliation of Author(s):控制科学与工程学院
Journal:MATERIALS
First Author:王译那
Indexed by:Unit Twenty Basic Research
Document Code:56FFB185C45442C39936D798F0417513
Volume:13
Issue:24
Number of Words:5
Translation or Not:no
Date of Publication:2020-12-01
Date of Publication:2020-12-01

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