Influence of Schottky drain contacts on the strained AlGaN barrier layer of AlGaN/AlN/GaN heterostructure field-effect transistors
Release Time:2019-04-14
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- Institution:
- 微电子学院
- Title of Paper:
- Influence of Schottky drain contacts on the strained AlGaN barrier layer of AlGaN/AlN/GaN heterostructure field-effect transistors
- Journal:
- Chinese Physics B
- Document Code:
- lw-145401
- Volume:
- 22
- Issue:
- 4
- Translation or Not:
- No
- Date of Publication:
- 2012-08
- Release Time:
- 2019-04-14