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Analysis of interface trap states in InAlN/AlN/GaN heterostructures

Release Time:2019-04-14

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Institution:: 微电子学院

Title of Paper:: Analysis of interface trap states in InAlN/AlN/GaN heterostructures

Journal:: Semiconductor Science and Technology

Document Code:: lw-164543

Volume:: 29

Translation or Not:: No

Date of Publication:: 2014-08

Release Time:: 2019-04-14

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