Effect of Polarization Coulomb Field Scattering on Electrical Properties of the 70-nm Gate-Length AlGaN/GaN HEMTs
Release time:2019-04-14
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- Affiliation of Author(s):
- 微电子学院
- Journal:
- scientific reports
- All the Authors:
- Cheng Aijie,linzhaojun
- First Author:
- cuipeng
- Indexed by:
- 综合研究
- Document Code:
- E7C0F50A9F8C4498BFABA944F654DD32
- Volume:
- 8
- Translation or Not:
- no
- Date of Publication:
- 2018-08-27