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Evaluating AlGaN/AlN/GaN heterostructure Schottky barrier heights with flat-band voltage from forward Current-Voltage characteristics

Release Time:2019-10-24
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Institution:
物理学院
Title of Paper:
Evaluating AlGaN/AlN/GaN heterostructure Schottky barrier heights with flat-band voltage from forward Current-Voltage characteristics
Journal:
APPLIED PHYSICS LETTERS
First Author:
林兆军
All the Authors:
Meng lingguo,林兆军
Document Code:
lw-96700
Volume:
99
Issue:
12
Page Number:
123504
Number of Words:
3000
Translation or Not:
No
Date of Publication:
2011-09
Release Time:
2019-10-24