Impact of Hafnium Doping on Phase Transition, Interface, and Reliability Properties of ZrxHf1–xO2-Based Capacitors.
发布时间：2026-04-01
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- 论文名称：
- Impact of Hafnium Doping on Phase Transition, Interface, and Reliability Properties of ZrxHf1–xO2-Based Capacitors.
- 发表刊物：
- ACS Applied Electronic Materials
- DOI码：
- 10.1021/acsaelm.4c01025
- 是否译文：
- 否
- 发表时间：
- 2024-08
- 发布时间：
- 2026-04-01