一种宽温域介电常数的无损光学测试方法及系统

Release time:2024-09-03|Hits:

Affilication of Author(s):前沿交叉科学青岛研究院

Type of Patent:发明

Application Number:202211540091.9

Number of Inventors:2

Service Invention or Not:no

Application Date:2022-11-30

Publication Date:2024-08-23

Authorization Date:2024-08-23