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Two-level image authentication by two-step phase-shifting interferometry and compressive sensing

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  • Affiliation of Author(s):信息科学与工程学院

  • Journal:Optics and Lasers in Engineering

  • All the Authors:mengxiangfeng,yinyongkai,Yang Xiulun,wangyurong

  • First Author:张学

  • Indexed by:Applied Research

  • Document Code:3D02E7AACB49485BBF1A75A67A225CFC

  • Volume:100

  • Page Number:118

  • Translation or Not:no

  • Date of Publication:2018-01-01

  • Date of Publication:2018-01-01

  • email:yinyongkai@sdu.edu.cn
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