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Synchrotron radiation x-ray topography applied to nitride semiconductor crystals

Release Time:2025-01-17| Hits:

Institution:新一代半导体材料研究院

Title of Paper:Synchrotron radiation x-ray topography applied to nitride semiconductor crystals

Journal:JOURNAL OF APPLIED PHYSICS

First Author:张祁瑞

Document Code:1794923048128266242

Volume:135

Issue:18

Number of Words:5

Translation or Not:No

Date of Publication:2024-05

Release Time:2025-01-17

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