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Thermally Evaporated SiO Serving as Gate Dielectric in Graphene Field-Effect Transistors

Release Time:2019-04-14
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Institution:
微电子学院
Title of Paper:
Thermally Evaporated SiO Serving as Gate Dielectric in Graphene Field-Effect Transistors
Journal:
IEEE Transactions on Electron Devices
First Author:
杨乐陶
All the Authors:
Xijian Zhang,Li Yuxiang,陈秀芳,徐现刚,赵显,Song A M
Document Code:
C378AC35A5AB4595ADA7AFF720512A91
Volume:
64
Issue:
4
Page Number:
1846
Translation or Not:
No
Date of Publication:
2017-04
Release Time:
2019-04-14