杜刘革   

Title:Professor
Main positions:教学科研教师
Other Post:无

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Language：English

Patents

Title : 一种用于有源阵列天线幅相测试的可调探头阵列

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Title:一种用于有源阵列天线幅相测试的可调探头阵列

Affilication of Author(s):信息科学与工程学院

Type of Patent:发明

Application Number:202010847551.7

Number of Inventors:2

Service Invention or Not:no

Publication Date:2021-08-27

Authorization Date:2021-08-27

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