杜刘革   

Title:Professor
Academic Titles:教学科研教师
Other Post:无

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Patents

Title of Award : 一种用于有源阵列天线幅相测试的可调探头阵列

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Title:一种用于有源阵列天线幅相测试的可调探头阵列

Institution:信息科学与工程学院

Type of Patent:Invent

Application Number:202010847551.7

Number of Inventors:2

Service Invention or Not:No

Publication Date:2021-08-27

Authorization Date:2021-08-27

Release Time:2021-09-29

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