韩吉胜
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Influence of post fabrication annealing on device performance of InAlN/GaN high electron mobility transistors
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Affiliation of Author(s): : 新一代半导体材料研究院

Title of Paper: : Influence of post fabrication annealing on device performance of InAlN/GaN high electron mobility transistors

Journal: : Journal of Physics and Chemistry of Solids

First Author: : 罗鑫

Document Code: : 1747462737015623682

Volume: : 187

Number of Words: : 4000

Translation or Not: : no

Date of Publication: : 2024-04-01

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Gender : Male

School/Department : 新一代半导体材料研究院

Date of Employment : 2020-11-15

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