Affiliation of Author(s): : 新一代半导体材料研究院
Title of Paper: : The Principles and Applications of Electrical Characterization Techniques for Electrically Active Defects in 4H-SiC Devices
Journal: : Physica Status Solidi A-Applications and Materials Science
First Author: : 罗兰
Document Code: : 1906642867614052353
Number of Words: : 8
Translation or Not: : no
Date of Publication: : 2025-01-01
Gender : Male
School/Department : 新一代半导体材料研究院
Date of Employment : 2020-11-15
The Last Update Time : ..
