韩吉胜
Personal Homepage
Paper Publications
Investigation of 1.2kV Trench SiC MOSFETs Reverse Recovery Performance at High Temperature
Hits:

Institution:新一代半导体材料研究院

Title of Paper:Investigation of 1.2kV Trench SiC MOSFETs Reverse Recovery Performance at High Temperature

Journal:21st China International Forum on Solid State Lighting and 10th International Forum on Wide Bandgap Semiconductors, SSLCHINA: IFWS 2024

First Author:王天露

Document Code:1897581192143368193

Page Number:179-183

Number of Words:3

Translation or Not:No

Date of Publication:2025-01

Release Time:2025-05-16

Personal information


Gender : Male

School/Department : 新一代半导体材料研究院

Date of Employment : 2020-11-15

Faculty/School : Integrated Technical Breakthrough Platform for New-generation Semiconductive Materials

You are visitors

The Last Update Time : ..


Copyright All Rights Reserved Shandong University Address: No. 27 Shanda South Road, Jinan City, Shandong Province, China: 250100
Information desk: (86) - 0531-88395114
On Duty Telephone: (86) - 0531-88364731 Construction and Maintenance: Information Work Office of Shandong University

MOBILE Version