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SiC 衬底上生长的 GaN 外延层的高分辨 X 射线衍射分析

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  • Affiliation of Author(s):晶体材料研究所

  • Journal:《人工晶体学报》

  • First Author:huxiaobo

  • Indexed by:Applied Research

  • Document Code:lw-158710

  • Translation or Not:no

  • Date of Publication:2014-05-05

  • Date of Publication:2014-05-05
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