中文

Influence of the misorientation of 6H-SiC substrate on the quality of GaN epilayer grown by MOVPE

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  • Affiliation of Author(s):晶体材料研究所

  • Journal:JOURNAL OF ALLOYS AND COMPOUNDS

  • All the Authors:xuxiangang

  • First Author:huxiaobo

  • Indexed by:Unit Twenty Basic Research

  • Document Code:lw-161338

  • Volume:509

  • Page Number:3656

  • Translation or Not:no

  • Date of Publication:2011-10-26

  • Date of Publication:2011-10-26

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