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一种对偏向SiC晶体的大边、小边精确定向方法

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  • Affilication of Author(s):晶体材料研究所

  • Patent Applicant:huxiaobo

  • Type of Patent:发明

  • Application Number:2017102791491

  • Number of Inventors:3

  • Service Invention or Not:no

  • Application Date:2017-04-25

  • Application Date:2017-04-25
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