Phase-pure ε-Ga2O3 thin films on c-plane sapphire substrates at low temperature by plasma-enhanced ALD: Growth, characterization, and interface analysis
发布时间:2025-05-27
所属单位:
晶体材料研究院(晶体材料全国重点实验室)
论文名称:
Phase-pure ε-Ga2O3 thin films on c-plane sapphire substrates at low temperature by plasma-enhanced ALD: Growth, characterization, and interface analysis