Paper Publications

Home

Influence of Schottky drain contacts on the strained AlGaN barrier layer of AlGaN/AlN/GaN heterostructure field-effect transistors

Release time:2019-10-24
Hits:
Affiliation of Author(s):
集成电路学院
Journal:
Chinese Physics B
All the Authors:
linzhaojun
First Author:
曹芝芳
Indexed by:
综合研究
Document Code:
lw-145401
Volume:
22
Issue:
4
Translation or Not:
no
Date of Publication:
2012-08-01