A Hybrid Simulation Technique to Investigate Bias-Dependent Electron Transport and Self-Heating in AlGaN/GaN HFETs
Release time:2023-11-10
Hits:
- Affiliation of Author(s):
- 集成电路学院
- Journal:
- IEEE Transactions on Electron Devices
- First Author:
- 王鸣雁
- Document Code:
- 1703670853552254977
- Page Number:
- 1-5
- Number of Words:
- 3
- Translation or Not:
- no
- Date of Publication:
- 2023-01-01