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A Hybrid Simulation Technique to Investigate Bias-Dependent Electron Transport and Self-Heating in AlGaN/GaN HFETs

Release Time:2023-11-10
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Institution:
集成电路学院
Title of Paper:
A Hybrid Simulation Technique to Investigate Bias-Dependent Electron Transport and Self-Heating in AlGaN/GaN HFETs
Journal:
IEEE Transactions on Electron Devices
First Author:
王鸣雁
Document Code:
1703670853552254977
Page Number:
1-5
Number of Words:
3
Translation or Not:
No
Date of Publication:
2023-01
Release Time:
2023-11-10