Paper Publications

Home >> Scientific Resear... >> Paper Publication...

Three-Dimensional Nondestructive Characterization of Extrinsic Frank-Type Stacking Faults in 4H-SiC Crystals

Release time:2025-02-18|Hits:

Affiliation of Author(s):光学高等研究中心

Journal:CRYSTAL GROWTH & DESIGN

Document Code:1869668689585999874

Number of Words:8

Translation or Not:no

Date of Publication:2024-12-10

Pre One:
Three-Dimensional (3D) Nondestructive Characterization of the Spatial Distribution and Complex Properties of Polytypes on 4H-SiC Wafers
Next One:
三种不同投影仪匀光整形系统匀光效果比较实验的设计与实现

中文    |   MOBILE Version   |   Login SDU   

Copyright All Rights Reserved Shandong University Address: No. 27 Shanda South Road, Jinan City, Shandong Province, China: 250100
Information desk: (86) - 0531-88395114
On Duty Telephone: (86) - 0531-88364731 Construction and Maintenance: Information Work Office of Shandong University

Click: Times

The Open Time: --

The Last Update Time: --