Paper Publications
Three-Dimensional Nondestructive Characterization of Extrinsic Frank-Type Stacking Faults in 4H-SiC Crystals
Release Time:2025-02-18
  • Institution:
    光学高等研究中心
  • Journal:
    CRYSTAL GROWTH & DESIGN
  • Document Code:
    1869668689585999874
  • Number of Words:
    8
  • Translation or Not:
    No
  • Date of Publication:
    2024-12
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