Paper Publications
         Three-Dimensional Nondestructive Characterization of Extrinsic Frank-Type Stacking Faults in 4H-SiC Crystals
    Release Time:2025-02-18
    
        
        
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                        Institution: 光学高等研究中心 
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                        Journal: CRYSTAL GROWTH & DESIGN 
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                        Document Code: 1869668689585999874 
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                        Number of Words: 8 
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                        Translation or Not: No 
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                        Date of Publication: 2024-12