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The effects of supercritical CO2 formulations on the removal of high-dose ion-implanted photoresists

Release time:2019-10-30
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Affiliation of Author(s):
微电子学院
Journal:
Microelectron. Eng.
All the Authors:
wangqingpu,Li Yuxiang
First Author:
李波
Indexed by:
Applied Research
Document Code:
lw-147346
Volume:
108
Page Number:
50
Translation or Not:
no
Date of Publication:
2013-04-06