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The Stripping Behavior of High-Dose Ion-Implanted Photoresists in Supercritical CO2 Formulations

Release time:2019-10-30
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Affiliation of Author(s):
微电子学院
Journal:
ECS J. Solid State Sci. & Tech.
All the Authors:
wangqingpu,Li Yuxiang
First Author:
李波
Indexed by:
Applied Research
Document Code:
lw-147347
Volume:
2
Issue:
4
Page Number:
73
Translation or Not:
no
Date of Publication:
2013-01-29