Wenxiang Mu
Associate Professor
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A review of β-Ga2O3 single crystal defects, their effects on device performance and their formation mechanism
  • Affiliation of Author(s):
    晶体材料研究院
  • Journal:
    Journal of Semiconductors
  • All the Authors:
    Zhitai Jia,Wenxiang Mu,yinyanru,zhangjian,Xutang Tao
  • First Author:
    fubo
  • Indexed by:
    Applied Research
  • Document Code:
    8731C0AB390E416686F784839D156A8B
  • Translation or Not:
    no
  • Date of Publication:
    2019-04-01

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