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Characterization of Electrical Properties of n-Type 4H-SiC Single Crystals by Raman Spectroscopy

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  • Affiliation of Author(s):晶体材料研究所

  • Journal:ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY

  • All the Authors:pengyan,chenxiufang,xuxiangang

  • First Author:huxiaobo

  • Indexed by:Applied Research

  • Document Code:lw-151711

  • Translation or Not:no

  • Date of Publication:2013-06-15

  • Date of Publication:2013-06-15
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