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一种半绝缘4H-SiC晶型的鉴别方法

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  • Affilication of Author(s):晶体材料研究所

  • Patent Applicant:yangxianglong,xuxiangang,huxiaobo,chenxiufang,pengyan

  • Type of Patent:发明

  • Application Number:201310502601.8

  • Number of Inventors:5

  • Service Invention or Not:no

  • Application Date:2013-10-23

  • Publication Date:2016-06-01

  • Authorization Date:2016-06-01

  • Publication Date:2016-06-01

  • Application Date:2013-10-23

  • Authorization Date:2016-06-01
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