Kai Qian, Viet Cuong Nguyen, Tupei Chen, Pooi See Lee*. “Amorphous-Si-Based Resistive Switching Memories with Highly Reduced Electroforming Voltage and Enlarged Memory Window” Adv. Electron. Mater. 2016, 2, 1500370.

Release time:2019-06-12|Hits:

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Included Journals:SCI