Kai Qian, Xu Han, Huakai Li, Tupei Chen, and Pooi See Lee*, "Uncovering the Indium Filament Revolution in Transparent Bipolar ITO/SiOx/ITO Resistive Switching Memories",ACS Appl. Mater. Interfaces 2020, 12, 4579−4585.
Release time:2020-02-14
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