Translation or Not:no
Paper Publications
Bowen Sun, Xu Han, Ruixue Xu, Kai Qian*, "Uncovering the Indium Filament Formation and Dissolution in Transparent ITO/SiNx/ITO Resistive Random Access Memory",ACS Appl. Electron. Mater. 2020, 2, 1603−1608
Release time:2021-01-28|Hits: