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In Situ Observation of Indium Filament Growth Dynamics in ITO Electrode-Based Memristor

Release time:2024-01-19
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Affiliation of Author(s):
集成电路学院
Journal:
Appl. Phys. Lett.,
Document Code:
4CA3816A617949FFA5CEF614E135FA3F
Issue:
15
Number of Words:
3
Translation or Not:
no
Date of Publication:
2023-10-11