Return Home
Paper Publications
Decoding “black-white band” defects in PVT grown 4H-SiC and its suppression through thermal field optimization.pdf
Release Time:2025-10-02
  • Institution:
    新一代半导体材料研究院
  • Journal:
    Materials Science in Semiconductor Processing
  • First Author:
    王江风
  • Document Code:
    018AA75C5EE4441F86E55AE76D5F9B3A
  • Issue:
    200
  • Number of Words:
    3
  • Translation or Not:
    No
  • Date of Publication:
    2025-08
Copyright All Rights Reserved Shandong University Address: No. 27 Shanda South Road, Jinan City, Shandong Province, China: 250100
Information desk: (86) - 0531-88395114
On Duty Telephone: (86) - 0531-88364731 Construction and Maintenance: Information Work Office of Shandong University