中文

High-Precision Short-Term Lifetime Prediction in TLC 3-D NAND Flash Memory as Hot-Data Storage

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  • Affiliation of Author(s):信息科学与工程学院

  • Journal:IEEE Transactions on CAD of Integrated Circuits and Systems (TCAD)

  • First Author:方晓彤

  • Document Code:341B005F1FFF43F0B6013C4D132303A1

  • Volume:42

  • Issue:10

  • Page Number:3224

  • Number of Words:3

  • Translation or Not:no

  • Date of Publication:2023-10-01

  • Date of Publication:2023-10-01

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