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Institution:晶体材料研究所

Title of Paper:Characterization of ZnSiP2 films frown on Si substrate by liquid phase epitaxy: morphology, composition, and interface microstructure

Journal:Crystal Growth&Design

Discipline:Engineering

First-Level Discipline:Materials Science and Engineering

Document Type:J

Volume:19

Issue:7

Page Number:3681-3687

Number of Words:5000

Translation or Not:No

Date of Publication:2019-06

Included Journals:SCI

Links to Published Journals:https://pubs.acs.org/doi/abs/10.1021/acs.cgd.8b01877

Release Time:2019-10-24