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A Dual-Point technique for the entire ID-VG characterization into subthreshold region under Random Telegraph Noise condition
Affiliation of Author(s):信息科学与工程学院
Journal:IEEE Electron Device Letters
All the Authors:Xuepeng Zhan
First Author:詹学鹏
Indexed by:Applied Research
Document Code:6342119359A14C5B9B0FA40E6D62BB09
Translation or Not:no
Date of Publication:2019-05-01