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Institution:信息科学与工程学院
Title of Paper:A Dual-Point technique for the entire ID-VG characterization into subthreshold region under Random Telegraph Noise condition
Journal:IEEE Electron Device Letters
First Author:詹学鹏
All the Authors:Xuepeng Zhan
Document Code:6342119359A14C5B9B0FA40E6D62BB09
Translation or Not:No
Date of Publication:2019-05
Release Time:2020-03-06