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Insights of VG-dependent threshold voltage fluctuations from dual-point random telegraph noise characterization in nanoscale transistors
Affiliation of Author(s):信息科学与工程学院
Journal:SCIENCE CHINA-Information Sciences
First Author:詹学鹏
Document Code:D36FB99582924BE0A75E74FDB0A74ACD
Issue:online
Number of Words:2
Translation or Not:no
Date of Publication:2021-08-31