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Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions
Affiliation of Author(s):信息科学与工程学院
Journal:IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
First Author:孔亚晨
Document Code:DC51743635044FA1AF7FBE65AB502142
Volume:39
Issue:11
Page Number:4042
Number of Words:5
Translation or Not:no
Date of Publication:2020-11-01