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Institution:信息科学与工程学院
Title of Paper:Insights of VG-dependent threshold voltage fluctuations from dual-point random telegraph noise characterization in nanoscale transistors
Journal:SCIENCE CHINA-Information Sciences
First Author:詹学鹏
Document Code:B70008A9605641C1ADB4B5FE304815E0
Issue:8
Number of Words:4
Translation or Not:No
Date of Publication:2022-07
Release Time:2022-09-09