Professor
Supervisor of Master's Candidates
The Last Update Time: ..
Significant Reliability Improvement by Inducing Dual Atomic-Thin Titanium Intercalation Layers in Hf 0.5 Zr 0.5 O 2 Films
Affiliation of Author(s):信息科学与工程学院
Journal:IEEE Electron Device Letters
First Author:台路
Document Code:070A75DB4BDD4252BB1C14460AEFBD1C
Issue:44(5)
Page Number:1
Number of Words:3
Translation or Not:no
Date of Publication:2023-05-01