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High-Precision Short-Term Lifetime Prediction in TLC 3-D NAND Flash Memory as Hot-Data Storage
Affiliation of Author(s):信息科学与工程学院
Journal:IEEE Transactions on CAD of Integrated Circuits and Systems (TCAD)
First Author:方晓彤
Document Code:341B005F1FFF43F0B6013C4D132303A1
Volume:42
Issue:10
Page Number:3224
Number of Words:3
Translation or Not:no
Date of Publication:2023-10-01