Using Raman spectroscopy and x-ray diffraction for phase determination in ferroelectric mixed Hf1−xZrxO2-based layers.
Release Time:2026-04-01
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- Title of Paper:
- Using Raman spectroscopy and x-ray diffraction for phase determination in ferroelectric mixed Hf1−xZrxO2-based layers.
- Journal:
- Journal of Applied Physics
- DOI Number:
- 10.1063/5.0119871
- Translation or Not:
- No
- Date of Publication:
- 2022-12
- Links to Published Journals:
- https://doi.org/10.1063/5.0119871
- Release Time:
- 2026-04-01