Title : 一种用于天线OTA测试的球面采样方法
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Title:一种用于天线OTA测试的球面采样方法
Affilication of Author(s):信息科学与工程学院
Type of Patent:发明
Application Number:202210117384.X
Number of Inventors:2
Service Invention or Not:no
Application Date:2022-02-08
Publication Date:2022-12-20
Authorization Date:2022-12-20
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