Title of Award : 一种用于天线OTA测试的球面采样方法
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Title:一种用于天线OTA测试的球面采样方法
Institution:信息科学与工程学院
Type of Patent:Invent
Application Number:202210117384.X
Number of Inventors:2
Service Invention or Not:No
Application Date:2022-02-08
Publication Date:2022-12-20
Authorization Date:2022-12-20
Release Time:2023-10-31
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