Parasitic source resistance at different temperatures for AlGaN/AlN/GaN heterostructure field-effect transistors
Release time:2019-04-14
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- Affiliation of Author(s):
- 微电子学院
- Journal:
- Chinese Physics B
- All the Authors:
- linzhaojun
- First Author:
- 刘艳
- Indexed by:
- 综合研究
- Document Code:
- C35C3AC632D94246822701F80872F058
- Volume:
- 26
- Issue:
- 9
- Translation or Not:
- no
- Date of Publication:
- 2017-09-01