Analysis of interface trap states in InAlN/AlN/GaN heterostructures
Release time:2019-10-24
Hits:
- Affiliation of Author(s):
- 集成电路学院
- Journal:
- Semiconductor Science and Technology
- All the Authors:
- linzhaojun
- First Author:
- 周阳
- Indexed by:
- 综合研究
- Document Code:
- lw-164543
- Volume:
- 29
- Number of Words:
- 2
- Translation or Not:
- no
- Date of Publication:
- 2014-08-01