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Effect of polarization Coulomb field scattering on device linearity in AlGaN/GaN heterostructure field-effect transistors

Release Time:2019-10-24
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Institution:
集成电路学院
Title of Paper:
Effect of polarization Coulomb field scattering on device linearity in AlGaN/GaN heterostructure field-effect transistors
Journal:
JOURNAL OF APPLIED PHYSICS
First Author:
崔鹏
All the Authors:
林兆军
Document Code:
F23E801B38C847F2A09CFE3045EEA09F
Volume:
122
Issue:
12
Translation or Not:
No
Date of Publication:
2017-09
Release Time:
2019-10-24